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| Customization: | Available |
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| Application: | Temperature Measurment & Optics Applying |
| Conductivity Type: | All |
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| Technical Data | Description & Value |
| Substrate | Monocrystalline silicon |
| Focal Length | +-2% @10.6um |
| Size Tolerance | 0/-0.15mm |
| Thickness Tolerance | +/-0.05mm |
| Optical Character | 2-5um @ Tave less than 1%; 5.5-14um @Tave more than 85% |
| Parallelism | Less than 1 arc min |
| Surface Finish | 60-40 scratch-dig |
| Coating | 4" or 6" |



