Customization: | Available |
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Application: | Temperature Measurment & Optics Applying |
Conductivity Type: | All |
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Technical Data | Description & Value |
Substrate | Monocrystalline silicon |
Focal Length | +-2% @10.6um |
Size Tolerance | 0/-0.15mm |
Thickness Tolerance | +/-0.05mm |
Optical Character | 2-5um @ Tave less than 1%; 5.5-14um @Tave more than 85% |
Parallelism | Less than 1 arc min |
Surface Finish | 60-40 scratch-dig |
Coating | 4" or 6" |