Product Description
RAYTEK DPSA600&DPSA1200 X-RAY Diffraction System Phase Analysis is a cutting-edge research tool that combines high precision, automation, and versatility. This system adopts the most advanced X-ray diffraction technology, which can deeply analyze the crystal structure of materials and provide strong support for research in multiple fields such as materials science, chemistry, physics, geology, and biomedicine. RAYTEK has become the preferred equipment for many research institutions and university laboratories due to its excellent performance and stable reliability.
Application areas:
Materials Science: The RAYTEK XRD system can be used to analyze the crystal structure and phase composition of various materials such as metals, alloys, ceramics, polymers, and composite materials, providing key data for material modification, optimization, and new material development.
Chemistry and pharmaceuticals: In the fields of chemistry and pharmaceuticals, this system can help researchers analyze the crystal structure of compounds, determine the polymorphic form of drugs, evaluate drug purity and stability, and optimize the preparation process of drug crystals.
Physics and Geology: Suitable for mineral identification, petrological research, and geological exploration, it can reveal the crystal structure, composition, and genesis of minerals, providing scientific basis for the development and utilization of geological resources.
Biopharmaceuticals: In biomedical engineering, the RAYTEK XRD system can be used for crystal structure analysis of biomolecules such as proteins and nucleic acids, providing important information for new drug development, disease diagnosis, and treatment.
Product Parameters
Specification |
Size |
78cm X 70cm X 91cm (L X D X H) |
Weight |
120Kg |
Rated Power |
1kW - 2kW |
X-ray Generator |
600W(40kV/15mA) |
1200W(40kV/30mA) |
Goniometer |
Standard Theta/Theta Angle measurer |
Goniometer |
Angular accuracy better than ±0.01° (2φ) |
X-ray Tube |
Ceramic X-ray tube,Cu/Co/Mo/Ag optional |
Detectors |
IDO640 Photon direct reading array detector |
IDO1280 Photon direct reading array detector |
TPX3Photon direct reading 2D detector |
Sample Stages |
Standard sample stage |
Rotating single or 12-position |
Rotary automatic sampler |
Thin film sample stand |
Capillary stand |
In situ sample stand |
Power Spec |
200-240V AC |
Cooling System |
Internal air cooling or external water cooling |
Operation Control |
External PC |
Our Advantages
Raytek DSPA600&DSPA1200 achieve unmanned automatic sample changing for you:
* The X-ray generation power can reach 1.2kw
* Array detector with up to 1280 microchannels
* 45 bit automatic sampler
* 15X3 automatic sample loading, measurement & data saving
* Flexible control of guided custom scripts
* Scalable integration into automated laboratories
* Automatic standby after testing is more environmentally friendly
For RAYTEK DSPA600&DSPA 1200, Modular control design is adopted:
(1). Modularization of functions such as data acquisition module, detector control module,radiation generation module, angle measuring instrument control module, and safety module;
(2). Hardware and software are modularized according to their usage functions, making it more convenient for users to replace samples and for engineers to maintain them
Main Components:
The Raytek DSPA600&1200 series diffractometers have performance and functionality comparable to traditional large diffractometers, mainly due to excellent system integration, high-quality components, and rich accessories. The N3 main components use internationally renowned mature products to ensure high performance and stability at every stage. The rich accessories meet the requirements of phase qualitative and quantitative analysis, thin film grazing incidence, thin film reflectivity, in-situ, and distribution function (PDF) analysis.
Main Attachments: Sample Stand and Optical System
1.Sample stand
* Standard sample stage
* Rotating sample stage
* Capillary sample stage
* Flat transmission sample stage
* Rotary automatic sampler
* In situ sample stage
(battery charging and discharging and temperature variation)
2.Optical System
* Manual and automatic slit
* Various specifications of Solar & Long Solar Flat
* Plate Collimators
* Anti scattering cover
Simple and Easy-to-use control software GUI
Raytek IdoMeas is a software system independently developed by Edo Nano for instrument control, data measurement , and some data analysis functions.
Main Functions of Raytek IdoMeas Software
1. Power Control
(1). X-ray source control
(2) Voltage/current settings
(3). X-ray switch control
(4) Shutter control
2. Detector settings
(1) Channels and angle settings
(2) Position and mode adjustment
3.Sample stage control
(1) Sample position loading and initialization
(2) Sample position adjustment
4. Goniometer control
(1). Various position controls (such as TubePos, Detector Pos, 2Theta, etc.)
(2) Scanning mode selection
(3) Scan type settings
5. Scanning parameter settings
(1) Scanning speed and step size settings
(2) Scanning range setting
6. Data Processing and Management
(1) Data storage and export
(2) Data comparison function
7. Other functions
(1) Equipment status monitoring
(2) Real time status display
(3) Security control
(4) Log recording
(5) Running logs
More Optimized Algorithms Safeguard Resolution & Accuracy
By relying on scientific and sophisticated optical programs as well as intelligent algorithms, the RAYTEK DSPA600&1200 series diffractometers achieve the ultimate performance data in terms of accuracy of peak angle, absolute intensity and signal-to-noise ratio of diffraction peaks, and minimum angular resolution, while also being comparable to most large diffractometers on the market.
Rich Optical And Sample Adapters Help You Achieve Different Application Scenarios
Conventional Powder Testing:The RAYTEK diffractometer can provide users with testing schemes and ultra-high quality data for various powder and film samples. Powder diffraction is one of the basic functions of the RAYTEK diffractometer. Its conventional testing method uses the B-B geometry (Bragg Brentano Geometry) reflection diffraction mode. The tube and detector are respectively on a circle centered on the sample. This test uses the θ/θ scanning mode.
XRD in transmission:Transmission is a testing mode of X-ray diffraction testing. When using transmission mode, X-rays pass through the sample to form diffraction. This mode is suitable for certain thin films, powders, and samples with good transmission, especially for diffraction of thinner or more complex microstructures. Compared with reflection mode, transmission mode increases the path of interaction between X-rays and crystal planes, thereby more effectively avoiding the influence of preferred orientation on peak intensity. For samples with complex internal structures (such as trace powders, multilayer structures, drugs, and other organic compounds with different crystallinity, etc.), transmission mode can provide reliable information and is therefore a better choice.
Rich Optical And Sample Adapters Help You Achieve Different Application Scenarios
Grazing incidence X-ray diffraction:Grazing incidence X-ray diffraction, as an advanced diffraction technique, avoids diffraction of deep layers or substrate materials of the sample and maximizes the detection of information from the surface area of the sample by precisely controlling the angle of X-ray incidence.
GIXRD has significant characteristics in terms of implementation form: the incident light is parallel and the incident angle remains low (within 5 °), and the diffraction pattern is completed by scanning the diffraction intensity at the diffraction angle through a detector. The core technology of this testing method is to generate incident light with high parallelism on an X-ray diffractometer.
X-ray Reflectivity Test:The reflectivity method is an important characterization method for liquid materials and solid surface properties. With the development of the semiconductor industry, the importance of X-ray reflectivity (XRR) testing technology is becoming increasingly prominent.
Compared to XRD, the XRR testing method utilizes the interference effect between the reflected and refracted light of X-rays on the surface and interface of thin films. In the case of differences in the electron cloud density of the medium, it can analyze both crystalline and amorphous materials. The classic applications of XRR testing include analyzing the total thickness of the film (generally not exceeding 1 μm), the thickness of each single layer of repeated multilayer thin films, the roughness of the material surface, and so on.
From a testing perspective, keeping the incident angle consistent with the exit angle also forms a θ/θ scanning mode.
Pre-install Professional RAYTEK Matches! Quantitative Analysis of software
(1). Rapid multiphase identification obtained from powder diffraction data
(2) .Suitable for Windows, macOS, and Linux operating systems
(3). Use free reference spectra (including I/Ic) calculated from COD, or from any ICDDPDF database, or from your diffraction data or crystal structure data for phase identification
(4). Qualitative analysis using innovative contour fitting search matching or classical peak based search matching
(5). Quantitative analysis using reference intensity ratio (RIR), Rietveld refinement, crystallinity (DOC), and/or internal standard method (as shown in tables and pie charts)
(6). Exponential calculation (using Treor or Dicvol) - Crystal structure solution (using Endeavour)
(7). Rietveld refinement and spectral decomposition (LeBail method) calculation, using the well-known FullProf software in the background
(8).Automatic raw data processing
(9) . Easily define/modify background using mouse - Easily edit peaks (add/move/delete/fit) using mouse
(10). Improve zoom and tracking functionality using a mouse or dialog box
(11). Display multiple diffraction patterns in 3D style for easy comparison
(12). Estimation of grain size based on Scherrer method
After Sales Service
RAYTEK is committed to providing customers with comprehensive services and support, including:
Pre sales consultation: Provide professional product consultation and technical support to help customers choose the most suitable XRD system for their research needs.
Installation and commissioning: Dispatch experienced engineers to conduct on-site installation and commissioning to ensure that the equipment reaches its optimal working condition.
Training service: Provide comprehensive operational training to customers to ensure that they can proficiently master the use of equipment and data analysis skills.
After sales support: Provide long-term after-sales service and technical support, including equipment maintenance, software upgrades, and technical consultation, to ensure that customers have no worries during use.
Customized service: Provide customized XRD solutions based on customers' special needs to meet their unique requirements in scientific research and production.
Packaging & Shipping
Main Export Countries & Areas:
USA, UK, Japan, Germany, Spain, France, Swiss, Korea, Russia, Mexico, Brazil, Argentina, Pakistan, India, Portugal, Canada, New Zealand, South Africa, UAE, Egypt, Norway, Netherland, Russia, Australia, Saudi Arab, Turkey, Finland, Poland ,etc.
Payment Method: by T/T or Western Union or L/C
Delivery time:6 months.
Quality Warranty: Shanghai Z-printing offers quality warranty for our lasers products with "3R" policy. For any inferior-quality products, Z-printing company is responsible for return, replacement and refund.